Ephraim Suhir
Contributions in the toolbox
- 1986
Interfacial shear-lag model for bonded assemblies — edge stress peaking, the microelectronics reference.
→ CTE Mismatch Thermal Stress
Interfacial shear-lag model for bonded assemblies — edge stress peaking, the microelectronics reference.
→ CTE Mismatch Thermal Stress